Digital Design & Architecture

  • – Micro-Architecture
  • – RTL Design
  • – RTL QC check : Lint, CDC & more
  • – SoC/Subsystem Integration
  • – Low Power Design Implementation
  • – UPF, CLP
  • – Timing Constraints, Synthesis, STA, LEC

Digital Verification

  • – Advanced IP & SoC Verification
  • – SV-UVM based Constraint – Random Verification
  • – Test Plan, Test Bench Development, Development of BFMs, Monitors, Assertions, Checkers, Debug Automation
  • – Low Power Verification (CPF/UPF flows)
  • – Gate Level Simulations – Test Bench BringUp (Identification of Sync Flops, Prioritisation of TestCases, Identification of Various CDC Paths, Resolution / Upgradation of Test Failures Due to X Propagation)
  • – PCIe, Ethernet, AMBA Protocols, RISC-V, DSP, Crypto processor – IP and Functional Verification in SoC environment
  • – Coverage – Toggle, Code, Functional
  • – Formal Verification
  • – VIP Development and Integration

Silicon Validation

Post Silicon Validation – ATP and Timeset Generation for J750 and Advance Teradyne Testers
EVCD Generation for Characterization
Die Yield Analysis on Wafersort
Parameterisation Tests – IO Leakage – Analog and Digital TX / RX, Stuck at Patterns, Sequences to detect PVT Corner values for IO Calibration, Regulator Calibrations, DC IO — Measurements (GPIOs, DDR PADs for Impedance and Hysteresis) & more

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